Magnification variations in reflection electron microscopy using diffracted beams
- 31 December 1975
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (2) , 145-150
- https://doi.org/10.1016/s0304-3991(75)80017-9
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- System for reflection electron microscopy and electron diffraction at intermediate energiesReview of Scientific Instruments, 1975
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- Energy Flow in the Neighborhood of the Focus of a Coherent Beam*Journal of the Optical Society of America, 1967