Circuit simulations of alpha-particle-induced soft errors in MOS dynamic RAMs
- 1 February 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 16 (1) , 31-34
- https://doi.org/10.1109/jssc.1981.1051532
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Alpha-Particle-Induced Soft Errors and 64K Dynamic RAM Design Interaction8th Reliability Physics Symposium, 1980
- Modeling diffusion and collection of charge from ionizing radiation in silicon devicesIEEE Transactions on Electron Devices, 1979
- A fault-tolerant 64K dynamic random-access memoryIEEE Transactions on Electron Devices, 1979
- Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliabilityIEEE Transactions on Electron Devices, 1979
- Alpha-particle-induced soft errors in dynamic memoriesIEEE Transactions on Electron Devices, 1979