Continuous improvement factor, CIF—A new, basic statistic
- 1 November 1995
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 35 (11) , 1443-1444
- https://doi.org/10.1016/0026-2714(95)00118-l
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Paradigms of quality for microelectronics and SMTMicroelectronics Reliability, 1991