Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscopy
- 1 January 1994
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 75 (1-4) , 151-156
- https://doi.org/10.1016/0169-4332(94)90152-x
Abstract
No abstract availableKeywords
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