An application of beta conductivity to measurement of resistivity distribution

This publication has 11 references indexed in Scilit:

• An Electron Beam Method of Measuring Resistivity Distribution in Semiconductors
  Japanese Journal of Applied Physics, 1967
• Detection of resistivity variation in a semiconductor pellet with an electron beam
  Microelectronics Reliability, 1967
• An Electron Beam Method of Measuring Deffusion Voltage in Semiconductors
  Japanese Journal of Applied Physics, 1967
• Electron Voltaic Effect at a Grain Boundary of CdS
  Japanese Journal of Applied Physics, 1966
• On the Voltage Induced by an Electron Beam in a Bulk Semiconductor Crystal
  Japanese Journal of Applied Physics, 1966
• The investigation of inhomogeneities in silicon single crystals by the method of photoelectric conductivity
  Czechoslovak Journal of Physics, 1966
• A Method of Measuring Lifetime for Minority Carriers Induced by an Electron Beam in Germanium
  Japanese Journal of Applied Physics, 1966
• Bulk Electron Voltaic Effect
  Japanese Journal of Applied Physics, 1965
• The Penetration of Electrons into Luminescent Materials
  Proceedings of the Physical Society, 1963
• The Penetration of Electrons into Luminescent Material
  Proceedings of the Physical Society. Section B, 1953