Determination of dielectric parameters for films at microwave frequencies
- 1 November 1973
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 44 (11) , 4927-4929
- https://doi.org/10.1063/1.1662064
Abstract
A technique for measuring the dielectric constant and loss of isotropic films by mounting the specimen longitudinally at the center of a rectangular waveguide is proposed. Experiments have been performed at 9.375 GHz on the samples of Mylar and Teflon films ranging in thickness from 75 to 250 μm. The experimental results agree well (within 1–2%) with the accepted values. Analytical numerical results for typical samples are also given.This publication has 5 references indexed in Scilit:
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