Spectroscopic ellipsometry measurements of Al Ga1−N in the energy range 3–25 eV
- 1 February 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 313-314, 745-750
- https://doi.org/10.1016/s0040-6090(97)00990-5
Abstract
No abstract availableKeywords
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