In situ measurements of strains and stresses in GaN heteroepitaxy and its impact on growth temperature
- 12 October 2004
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 272 (1-4) , 72-75
- https://doi.org/10.1016/j.jcrysgro.2004.08.031
Abstract
No abstract availableKeywords
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