High resolution energy-loss spectroscopy

This publication has 14 references indexed in Scilit:

• Parallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscope
  Review of Scientific Instruments, 1988
• Electron-Energy-Loss Scattering near a Single Misfit Dislocation at the GaAs/GaInAs Interface
  Physical Review Letters, 1986
• High-energy resolution electron spectrometer for 1-nm spatial analysis
  Review of Scientific Instruments, 1986
• The structural sensitivity of electron energy-loss near-edge structure (ELNES)
  Ultramicroscopy, 1985
• The inelastic scattering matrix element and its application to electron energy loss spectroscopy
  Philosophical Magazine A, 1983
• The IBM computer-stem system
  Ultramicroscopy, 1982
• Orientation-dependent extended fine structure in electron-energy-loss spectra
  Physical Review B, 1982
• K, L, and M shell generalized oscillator strengths and ionization cross sections for fast electron collisions
  The Journal of Chemical Physics, 1980
• Extended Fine Structure on the Carbon Core-Ionization Edge Obtained from Nanometer-Sized Areas with Electron-Energy-Loss Spectroscopy
  Physical Review Letters, 1979
• CarbonKEdge in Graphite Measured Using Electron-Energy-Loss Spectroscopy
  Physical Review Letters, 1978