Computer peak identification in SIMS
- 1 September 1980
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 35 (3-4) , 225-230
- https://doi.org/10.1016/0020-7381(80)80076-3
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Measurement analysis by pattern recognitionAnalytical Chemistry, 1975
- Computer program for peak identification in secondary ion mass spectraVacuum, 1975
- Experience with a Computer Program for Residual Gas AnalyzersJournal of Vacuum Science and Technology, 1972