Yield optimization of nonlinear circuits with statistically characterized devices
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 649-652 vol.2
- https://doi.org/10.1109/mwsym.1989.38809
Abstract
A comprehensive treatment of yield optimization of nonlinear microwave circuits with statistically characterized devices is proposed. The authors fully exploit advanced techniques of a one-sided l/sub 1/ circuit centering with gradient approximations and efficient harmonic balance simulation with exact Jacobians. Multidimensional statistical distributions of the intrinsic and parasitic parameters of field-effect transistors are fully handled. Yield is driven from 25% to 61% for a frequency doubler design having 34 statistically toleranced parameters. The yield of a small-signal amplifier is increased from 36% to 68%.Keywords
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