FET model statistics and their effects on design centering and yield prediction for microwave amplifiers
- 6 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 315-318
- https://doi.org/10.1109/mwsym.1988.22039
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Circuit optimization: the state of the artIEEE Transactions on Microwave Theory and Techniques, 1988
- A sensitivity figure for yield improvement (manufacturable microwave circuit design)IEEE Transactions on Microwave Theory and Techniques, 1988
- Centering and Tolerancing the Components of Microwave AmplifiersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1987