Piezoresistance Constants of-Type InSb
- 15 March 1958
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 109 (6) , 1980-1987
- https://doi.org/10.1103/physrev.109.1980
Abstract
The change of resistance in uniaxial tension was measured for several single-crystal specimens of -type InSb over the range 77°K to 350°K. The difference between the donor and acceptor concentrations for these specimens ranges from 3× to 7× . The piezoresistance coefficients were found to depend on impurity concentration. The elasto-Hall constant was measured at 77°K for the purest specimens and the experimental results indicate that, in the extrinsic range, the large piezoresistance is primarily due to stress induced changes in the tensor mobility of the holes. The shear coefficients were found to vary approximately linearly with in the extrinsic range. It is concluded that the valence band extrema occur at, or very near, K=0 in the Brillouin zone with energy surfaces similar to those of Si and Ge.
Keywords
This publication has 22 references indexed in Scilit:
- Piezoresistive Effect in Indium AntimonidePhysical Review B, 1957
- Elastoresistance Constants of-Type InSb at 77°KPhysical Review B, 1957
- Temperature Dependence of the Piezoresistance of High-Purity Silicon and GermaniumPhysical Review B, 1957
- Piezoresistance in BismuthPhysical Review B, 1956
- Elastogalvanomagnetic Effect and Intervalley Scattering in-Type GermaniumPhysical Review B, 1956
- Elastic Moduli of Indium AntimonidePhysical Review B, 1956
- Transport and Deformation-Potential Theory for Many-Valley Semiconductors with Anisotropic ScatteringPhysical Review B, 1956
- Temperature Dependence of the Elastoresistance in-Type GermaniumPhysical Review B, 1955
- Elastoresistance in-Type Ge and SiPhysical Review B, 1954
- Piezoresistance Effect in Germanium and SiliconPhysical Review B, 1954