Self‐Diffusion Measurements in Silver at Low Temperatures Using Single Crystals and Slightly Deformed Crystals
- 1 July 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 64 (1) , 151-162
- https://doi.org/10.1002/pssb.2220640119
Abstract
By means of a chemical peeling technique tracer self‐diffusion measurements have been performed in silver single crystals in the temperature range of 350 to 580 °C. The influence of plastic deformation on the diffusion coefficient was investigated a t 436 °C and proved to be considerable. An analysis of the data, obtained from undeformed crystals, in terms of a mono‐ and divacancy contribution has been made to explain the curvature in the plot of In D versus 1/T. Values for the diffusion parameters obtained in this way are in close agreement with those of Lam et al.Keywords
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