Self‐Diffusion Measurements in Silver at Low Temperatures Using Single Crystals and Slightly Deformed Crystals

Abstract
By means of a chemical peeling technique tracer self‐diffusion measurements have been performed in silver single crystals in the temperature range of 350 to 580 °C. The influence of plastic deformation on the diffusion coefficient was investigated a t 436 °C and proved to be considerable. An analysis of the data, obtained from undeformed crystals, in terms of a mono‐ and divacancy contribution has been made to explain the curvature in the plot of In D versus 1/T. Values for the diffusion parameters obtained in this way are in close agreement with those of Lam et al.