Sources of error in ellipsometry
- 31 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 67-73
- https://doi.org/10.1016/0039-6028(69)90005-3
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The effect of sample cell windows in precision polarimetryJournal of Scientific Instruments, 1966
- New High-Precision Photoelectric Universal Polarimeter and Birefringence Compensator*Journal of the Optical Society of America, 1964
- Analysis of elliptically polarized lightJournal of the Optical Society of America, 1960
- A Quarter-Wave Compensator with a Sensitive Half-Shadow DeviceJournal of the Optical Society of America, 1954
- A Spherical Projection Chart for Use in the Study of Elliptically Polarized LightJournal of the Optical Society of America, 1930