Fault detection in CMOS circuits by consumption measurement
- 1 June 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 38 (3) , 773-778
- https://doi.org/10.1109/19.32191
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Fault detection in CMOS circuits by consumption measurementIEEE Transactions on Instrumentation and Measurement, 1989
- Fault Detection by Consumption Measurement in CMOS CircuitsPublished by Springer Nature ,1987
- Testing for Bridging Faults (Shorts) in CMOS CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983
- Fault Modeling and Logic Simulation of CMOS and MOS Integrated CircuitsBell System Technical Journal, 1978