The activation energy for electromigration and grain-boundary self-diffusion in gold
- 31 October 1973
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 7 (10) , 1027-1030
- https://doi.org/10.1016/0036-9748(73)90007-0
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Electromigration in thin gold filmsJournal of Physics F: Metal Physics, 1973
- Electromigration-Induced Failures in, and Microstructure and Resistivity of, Sputtered Gold FilmsJournal of Applied Physics, 1972