Electromigration in thin gold films
- 1 April 1973
- journal article
- Published by IOP Publishing in Journal of Physics F: Metal Physics
- Vol. 3 (4) , 691-696
- https://doi.org/10.1088/0305-4608/3/4/010
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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- Electromigration Damage in Aluminum Film ConductorsJournal of Applied Physics, 1970
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- Electromigration in Thin Al FilmsJournal of Applied Physics, 1969
- RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMSApplied Physics Letters, 1968
- Influence of Oxygen on the Adherence of Gold Films to Oxide SubstratesJournal of Applied Physics, 1966
- Current-induced marker motion in gold wiresJournal of Physics and Chemistry of Solids, 1961