Contrast formation mechanism for the surface defects imaged by x-ray topography under the condition of simultaneous specular and Bragg reflections
- 13 January 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 60 (2) , 177-179
- https://doi.org/10.1063/1.107438
Abstract
X-ray topography using extremely asymmetric diffraction under the specular reflection condition is effective for imaging a short-range strain field near the surface. This experimental condition is easily realized by utilizing the tunability of synchrotron radiation. The surface defect images are clearly observed as a result of the reduction of background due to dynamical diffraction from the highly perfect bulk crystal.Keywords
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