Electron Spin Resonance Measurements and Electrical Characteristics, before and after Electroforming, of Thin Films of SiO/Nb205 and Nb205
- 16 May 1985
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 89 (1) , 363-374
- https://doi.org/10.1002/pssa.2210890138
Abstract
No abstract availableKeywords
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