A Framework for Boundary-Scan Based System Test and Diagnosis
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 993
- https://doi.org/10.1109/test.1992.527927
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Achieving Board-Level BIST Using the Boundary-Scan MasterPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System BackplanesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005