Investigation of STM image artifacts by in-situ reflection electron microscopy
- 1 April 1993
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 48 (4) , 433-444
- https://doi.org/10.1016/0304-3991(93)90119-i
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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