Molecular and chemical effects in Auger processes induced by molecular ions
- 1 September 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 28 (3) , 1873-1875
- https://doi.org/10.1103/physreva.28.1873
Abstract
The Auger electrons ejected under and ion bombardments were measured at the backward directions. The observed ratio of the Auger-electron yield per proton for to that for ejected from oxidized aluminum foils increases from 1.0±0.1 to 1.6±0.1 with an increase of the projectile energy from 0.25 to 1.2 MeV/amu, whereas the ratio for oxide-free aluminum foils remains approximately constant (1.1±0.1). First-order perturbation theory fails to reproduce the observed results for both targets.
Keywords
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