Total-Reflection X-Ray Fluorescence Analysis Using Monochromatic Beam
- 1 November 1984
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 23 (11R) , 1543
- https://doi.org/10.1143/jjap.23.1543
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A highly sensitive energy-dispersive X-ray spectrometer with multiple total reflection of the exciting beamNuclear Instruments and Methods in Physics Research, 1982
- Totalreflexions-RöntgenfluoreszenzanalyseX-Ray Spectrometry, 1979
- XRF analysis - some sensitivity comparisons between charged-particle and photon excitationNuclear Instruments and Methods, 1977
- Optical Flats for Use in X-Ray Spectrochemical MicroanalysisReview of Scientific Instruments, 1971