Determining the refractive index and thickness of thin films from prism coupler measurements
- 15 June 1981
- journal article
- research article
- Published by Optica Publishing Group in Applied Optics
- Vol. 20 (12) , 2085-2089
- https://doi.org/10.1364/ao.20.002085
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 6 references indexed in Scilit:
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- Numerical solution of the mode-equation of planar dielectric waveguides to determine their refractive index and thickness by means of a prism-film couplerOptics Communications, 1973
- Measurement of Thin Film Parameters with a Prism CouplerApplied Optics, 1973
- Normal-mode analysis of anisotropic and gyrotropic thin-film waveguides for integrated opticsJournal of Applied Physics, 1972