Proton-induced X-ray cross sections for selected elements Fe to As and applications of X-ray analysis to semiconductor systems

Publisher Website

1 December 1973

journal article
Published by Elsevier in Thin Solid Films

Vol. 19 (1) , 103-119
https://doi.org/10.1016/0040-6090(73)90028-x

Abstract

No abstract available

Keywords

This publication has 15 references indexed in Scilit:

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