Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model
- 19 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Single event upset and charge collection measurements using high energy protons and neutronsIEEE Transactions on Nuclear Science, 1994
- Single event phenomena in atmospheric neutron environmentsIEEE Transactions on Nuclear Science, 1993
- New insight into proton-induced latchup: Experiment and modelingApplied Physics Letters, 1993
- Effect of Cosmic Rays on Computer MemoriesScience, 1979