Accurate X-Ray Diagnostics of Electron Beam X-Ray Simulators
- 1 January 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 25 (6) , 1634-1639
- https://doi.org/10.1109/TNS.1978.4329585
Abstract
An efficient calculational code, FLASH, is being developed to predict accurate x-ray spectral distributions for pulsed, electron-beam x-ray sources. This code uses the x-ray diode voltage and current histories to predict the x-ray spectra on an individual shot basis. Calculated spectra have been compared with experimental spectral measurements for 100, 200, and 1000 kV sources and for Fe, Gd, and Ta targets. Agreement between calculated and measured spectra is within 30 percent on an absolute basis.Keywords
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