The growth of CoSi2 through an oxide layer: dependence on Si(100) surface structure
- 18 December 2000
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 379 (1-2) , 265-271
- https://doi.org/10.1016/s0040-6090(00)01564-9
Abstract
No abstract availableKeywords
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