Relative intensities in X-ray photoelectron spectra. Part IX. Estimates for photoelectron mean free paths taking into account elastic collisions in a solid
- 31 December 1982
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 27 (2) , 109-118
- https://doi.org/10.1016/0368-2048(82)85057-3
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Photoionization cross sections and photoelectron angular distributions for x-ray line energies in the range 0.132–4.509 keV targets: 1 ≤ Z ≤ 100Published by Elsevier ,2004
- Relative intensities in X-ray photoelectron spectra.: Part VIIIJournal of Electron Spectroscopy and Related Phenomena, 1981
- Determination of the reduced thickness of surface layers by means of the substrate methodJournal of Electron Spectroscopy and Related Phenomena, 1981
- Relative intensities in X-ray photoelectron spectra: Part VII. The effect of elastic scattering in a solid on the angular distribution of photoelectrons escaping from samples covered with thin films of various thicknessesJournal of Electron Spectroscopy and Related Phenomena, 1980
- Relative intensities in x-ray photoelectron spectra: Part IV. The effect of elastic scattering in a solid on the free path of electrons and their angular distributionJournal of Electron Spectroscopy and Related Phenomena, 1979
- Instrumentation for surface studies: XPS angular distributionsJournal of Electron Spectroscopy and Related Phenomena, 1974
- Escape length of Auger electronsJournal of Applied Physics, 1973