Measurement of the intrinsic stress in thin films of silver by a new cantilevered plate technique
- 1 January 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 75 (3) , 213-219
- https://doi.org/10.1016/0040-6090(81)90398-9
Abstract
No abstract availableKeywords
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