Ion milled tips for scanning tunneling microscopy
- 16 March 1987
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 50 (11) , 696-698
- https://doi.org/10.1063/1.98070
Abstract
Ion milling of electrochemically etched tungsten tips is shown to improve the characteristics for scanning tunneling microscopy. The primary mechanism for the enhancement of tip reliability is identified to be the removal of a residual oxide. A greatly decreased radius of curvature is also achieved without significantly changing the macrostructural geometry of the tip.Keywords
This publication has 4 references indexed in Scilit:
- Mono-atomic tips for scanning tunneling microscopyIBM Journal of Research and Development, 1986
- Role of tip structure in scanning tunneling microscopyApplied Physics Letters, 1986
- High resolution structuring of emitter tips for the gaseous field ionization sourceJournal of Vacuum Science & Technology B, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982