Scanning Tunneling Microscopy of Semiconductor Electrodes
- 29 June 1995
- book chapter
- Published by Wiley in Advances in Electrochemical Sciences and Engineering
Abstract
No abstract availableKeywords
This publication has 163 references indexed in Scilit:
- Evaluation of surface roughness of technological InP substrates by in situ scanning tunneling microscopy imaging in H2SO4 solutionApplied Physics Letters, 1992
- Probing hot-carrier transport and elastic scattering using ballistic-electron-emission microscopyPhysical Review B, 1992
- Modification of HF-treated silicon (100) surfaces by scanning tunneling microscopy in air under imaging conditionsApplied Physics Letters, 1992
- In situ scanning tunneling microscopy observation of surface morphology of GaAs(001) grown by molecular beam epitaxyApplied Physics Letters, 1992
- Experimental investigation of charge transfer at the semiconductor/electrolyte junctionElectrochimica Acta, 1992
- Comparison of Si(111) surfaces prepared using aqueous solutions of NH4F versus HFApplied Physics Letters, 1991
- Chemically etched silicon surfaces viewed at the atomic level by force microscopyJournal of the American Chemical Society, 1991
- The impact of semiconductors on the concepts of electrochemistryElectrochimica Acta, 1990
- Impedance studies at semiconductor electrodes: classical and more exotic techniquesElectrochimica Acta, 1990
- Nanolithography on semiconductor surfaces under an etching solutionApplied Physics Letters, 1990