Photo-emission-electron-microscopy for characterization of an operating organic electronic device

This publication has 13 references indexed in Scilit:

• Influence of nanomorphology on the photovoltaic action of polymer–fullerene composites
  Nanotechnology, 2004
• Preparation of stoichiometric CuInS2 surfaces
  Thin Solid Films, 2004
• Carbon-plot-microstructuring for all-polymer-transistors
  Synthetic Metals, 2003
• Preparation of stoichiometric CuInS2 surfaces—an XPS and UPS study
  Thin Solid Films, 2003
• PEEM and μ-NEXAFS of CuInS2-surfaces
  Thin Solid Films, 2003
• Noncontact potentiometry of polymer field-effect transistors
  Applied Physics Letters, 2002
• A Spectro-Microscopic Approach to Study the Morphology and Elemental Distribution of mc-Si Surfaces
  Physica Status Solidi (b), 1999
• Lateral Doping Inhomogeneities as Revealed by μ-NEXAFS and μ-PES
  Solid State Phenomena, 1998
• Soluble and processable regioregular poly(3-hexylthiophene) for thin film field-effect transistor applications with high mobility
  Applied Physics Letters, 1996
• Methods and application of UV photoelectron microscopy in heterogenous catalysis
  Ultramicroscopy, 1991