Laboratory EXAFS spectrometer with a bent crystal, a solid-state detector, and a fast detection system

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Abstract
A laboratory x-ray absorption spectrometer is described which consists of a Johansson-cut bent crystal, a rotating anode x-ray generator, and a fast SSD (solid-state detector). Because the SSD can completely discriminate the undesired reflections, contamination of the harmonics is avoided while maintaining a high-source voltage necessary for strong x-ray flux. Fast electronics equipment is employed to keep up with high-x-ray intensity. It is also possible to utilize higher-order reflections for high resolving power. The data of quality comparable to those obtained at synchrotron radiation facilities can be obtained in a comparable period of time. In addition, the determination of the absolute absorbance as defined is possible, which makes the problem of the background subtraction in EXAFS analysis easy.