Recovery of refractive-index profiles of planar graded-index waveguides from measured mode indices: an iteration method
- 1 August 1992
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 9 (8) , 1301-1305
- https://doi.org/10.1364/josaa.9.001301
Abstract
An iteration method for calculating refractive-index profiles of graded-index waveguides from measured effective indices is presented. The refractive-index profiles recovered from the effective indices for the exponential function indicate that the accuracy of this method is better than ±10-4. We apply this method to Ti in-diffused Fe2 O3-LiNbO3 and two-step ion-exchanged glass waveguides and obtain a good agreement between the theoretical and the experimental values.Keywords
This publication has 11 references indexed in Scilit:
- Improved inverse WKB procedure to reconstruct refractive index profiles of dielectric planar waveguidesApplied Physics B Laser and Optics, 1987
- Construction of refractive-index profiles of planar dielectric waveguides from the distribution of effective indexesJournal of Lightwave Technology, 1985
- Refractive-index profile measurement of highly multimode planar waveguides by guided-beam trackingOptics Letters, 1982
- Recovery of the refractive-index profile of an optical waveguide from the measured coupling anglesApplied Optics, 1980
- High efficiency input–output prism waveguide coupler: an analysisApplied Optics, 1979
- Precise determination of refractive index and thickness in the Ti-diffused LiNbO_3 waveguideJournal of the Optical Society of America, 1978
- Optical waveguide refractive index profiles determined from measurement of mode indices: a simple analysisApplied Optics, 1976
- Direct technique for calculating dielectric permittivity profiles from the distribution of mode indices in waveguidesJournal of the Optical Society of America, 1975
- Measurement of Thin Film Parameters with a Prism CouplerApplied Optics, 1973
- Modes in optical waveguides formed by diffusionApplied Physics Letters, 1973