Optical characterization of thin films by guided waves
- 15 July 1989
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 28 (14) , 2918-2924
- https://doi.org/10.1364/ao.28.002918
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 8 references indexed in Scilit:
- In situ and air index measurements: influence of the deposition parameters on the shift of TiO_2/SiO_2 Fabry-Perot filtersApplied Optics, 1986
- Ion-based methods for optical thin film depositionJournal of Materials Science, 1986
- Refractive index and inhomogeneity of thin filmsApplied Optics, 1984
- Characterizations of optical surfaces by measurement of scattering distributionApplied Optics, 1984
- An improved method for the determination of the extinction coefficient of thin film materialsThin Solid Films, 1983
- Automatic determination of the optical constants of inhomogeneous thin filmsApplied Optics, 1982
- Measurement of Thin Film Parameters with a Prism CouplerApplied Optics, 1973
- Optical filters: Monitoring process allowing the auto-correction of thickness errorsThin Solid Films, 1972