Transverse Magnetoresistivity Anisotropy Measurements and the Geometrical Size Effect in Nickel Thin Films
- 1 April 1972
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 43 (4) , 1554-1558
- https://doi.org/10.1063/1.1661360
Abstract
The transverse magnetoresistivity anisotropy in both polycrystalline and single-crystal nickel films have been measured at room, liquid-nitrogen, and liquid-helium temperatures. A correction for the demagnetization field effect has been performed on the measured data. The size effects in nickel thin films have been estimated from the corrected results. It is found that these size effects depend on the electronic structure of the material and cannot be explained by the present theories of the electron conduction phenomena in thin films.This publication has 7 references indexed in Scilit:
- Low field magnetoresistance of nickel polycrystalsJournal of Physics and Chemistry of Solids, 1971
- Magnetoresistance of Nickel-Copper Single-Crystal Thin FilmsJournal of Applied Physics, 1967
- Magnetoresistance and Hall-Voltage Measurements on Single-Crystal Ni and Ni-Fe Thin FilmsJournal of Applied Physics, 1964
- Magneto-resistance in metalsPhilosophical Magazine, 1957
- The Influence of a Transverse Magnetic Field on the Conductivity of Thin Metallic FilmsPhysical Review B, 1950
- Size effect variation of the electrical conductivity of metalsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1950
- Die Abhängigkeit des Widerstandes von Nickelkristallen von der Richtung der spontanen MagnetisierungAnnalen der Physik, 1938