Millimeter-wave noise parameters of high-performance HEMTs at 300 K and 17 K
- 13 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Ultra-low-noise cryogenic high-electron-mobility transistorsIEEE Transactions on Electron Devices, 1988
- Determination of Microwave Two-Port Noise Parameters Through Computer-Aided Frequency-Conversion TechniquesIEEE Transactions on Microwave Theory and Techniques, 1979