Ellipsometric method for separate measurements of n and d of a transparent film
- 1 August 1975
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 14 (8) , 2010-2015
- https://doi.org/10.1364/ao.14.002010
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 4 references indexed in Scilit:
- Continuous Ellipsometric Determination of the Optical Constants and Thickness of a Silver Film during DepositionJapanese Journal of Applied Physics, 1969
- Automatic Ellipsometer Automatic Polarimetry by Means of an ADP Polarization Modulator IIIApplied Optics, 1966
- Transmission of Light through Birefringent and Optically Active Media: the Poincaré SphereJournal of the Optical Society of America, 1954
- La détermination de l'indice et de l'épaisseur des couches minces transparentesJournal de Physique et le Radium, 1950