Measurements of small-signal photo-EMF of Si and Ge MIS structures using scanning light probe

This publication has 7 references indexed in Scilit:

• Semiconductor profiling using an optical probe
  Solid-State Electronics, 1975
• Frequency dependence of photo-EMF of strongly inverted Ge and Si MIS structures—II experiments
  Solid-State Electronics, 1975
• Frequency dependence of the photo-EMF of strongly inverted Ge and Si MIS structures—I. Theory
  Solid-State Electronics, 1975
• Investigations of mis structure inhomogeneities using a scanning mercury probe
  Physica Status Solidi (a), 1973
• Description of the SiO2Si interface properties by means of very low frequency MOS capacitance measurements
  Surface Science, 1971
• Barrier Inhomogeneities on a Si–SiO2 Interface by Scanning Internal Photoemission
  Applied Physics Letters, 1971
• The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique
  Bell System Technical Journal, 1967