A triple-through method for characterizing test fixtures

1 June 1988

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques

Vol. 36 (6) , 1043-1046
https://doi.org/10.1109/22.3630

Abstract

Test fixtures for evaluating microwave components usually consist of two unmeasurable sections, each having, for example, one coaxial and one microstrip terminal. A method is proposed for evaluating the S-parameters of these sections through three conventional reflection/transmission measurements. The method rests on the use of an auxiliary two-port. No microstrip standard is needed, except for a load that is necessary if the SWR (standing wave ratio) of the auxiliary two-port is not low enough. Only one reflection measurement with a load has to be performed on the auxiliary two-port. This may even by canceled if this two-port is a transition with low SWR. The method is broadband, frequency-insensitive, and extendable to other media. A method is presented based on three reflection/transmission measurements that minimizes the microstrip hardware, only a load is needed or even no standard at all. The method is directly adaptable to other environments such as waveguide and finline.SCOPUS: ar.jinfo:eu-repo/semantics/publishe

Keywords

This publication has 3 references indexed in Scilit:

Symmetric Test Fixture Calibration
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
Wide-band de-embedding with a short, an open, and a through line
Proceedings of the IEEE, 1986
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IEEE Transactions on Microwave Theory and Techniques, 1976