Auger Microscopy and Electron Probe Microanalysis
- 1 January 1992
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 33 references indexed in Scilit:
- A new approach in non‐destructive characterization and X-Y profilometry of coatingsSurface and Interface Analysis, 1990
- Quantitative AES: Via the inelastic mean free path or the attenuation length?Surface and Interface Analysis, 1990
- Growth of single-crystal Fe/Cr magnetic multilayer structures on (001) GaAs by molecular beam epitaxyJournal of Crystal Growth, 1989
- Recent advances in electron-probe x-ray microanalysisAnalytica Chimica Acta, 1989
- The quest for universal curves to describe the surface sensitivity of electron spectroscopiesJournal of Electron Spectroscopy and Related Phenomena, 1988
- Grain-boundary compositions in YBa2Cu3O7−x from Auger electron spectroscopy of fracture surfacesJournal of Applied Physics, 1988
- A study of adsorption and desorption processes of Ag on Si(111) surface by means of RHEED-TRAXSSurface Science, 1987
- Surface chemical analysis—report on the vamas projectSurface and Interface Analysis, 1986
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968
- Electron Probe MicroanalysisPublished by Elsevier ,1960