Quantitative AES: Via the inelastic mean free path or the attenuation length?

This publication has 36 references indexed in Scilit:

• American society for testing and materials standard definitions of terms relating to surface analysis (E673‐88a)
  Surface and Interface Analysis, 1989
• Influence of the matrix on boron detection by auger electron spectroscopy (AES)
  Journal of Electron Spectroscopy and Related Phenomena, 1988
• The inelastic mean free path of electrons in the ordered Al₄₈Ni₅₂ alloy
  Surface and Interface Analysis, 1988
• American Society for Testing and Materials standard definitions of terms relating to surface analysis (E 673–85b)
  Surface and Interface Analysis, 1987
• Recent developments in quantitative surface analysis by electron spectroscopy
  Journal of Vacuum Science & Technology A, 1986
• A practical method for determining backscattering factors and matrix correction in quantitative aes analysis of binary alloys
  Surface and Interface Analysis, 1984
• American society for testing and materials, standard definitions of terms relating to surface analysis (E673–82)
  Surface and Interface Analysis, 1983
• Assessment of different models for quantitative Auger analysis in applied surface studies
  Applications of Surface Science, 1983
• Calculations of the backscattering factor for L3MM Auger transitions
  Surface and Interface Analysis, 1980
• Backscattering effects in Auger electron spectroscopy: A review
  Surface and Interface Analysis, 1979