Test of annealed Czochralski grown silicon crystals as X-ray diffraction elements with 145 keV synchrotron radiation

This publication has 10 references indexed in Scilit:

• Annealed Czochralski grown silicon crystals: A new material for the monochromatisation of synchrotron radiation and X-rays above 60 keV
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
• Coupled neutron – γ-ray diffraction: a method for accurate measurement of strains. Application to the study of the ferroelectric phase transition of KH₂PO₄
  Journal of Applied Crystallography, 1987
• Resolution function of an X-ray triple-crystal diffractometer
  Acta Crystallographica Section A Foundations of Crystallography, 1987
• Characterization of the 100 K phase transition in SrTiO₃by means of high-resolution γ-ray diffractometry
  Phase Transitions, 1986
• Fortschritte bei der experimentellen Bestimmung der Ladungsdichte in Kristallen, II
  The Science of Nature, 1985
• Fortschritte bei der experimentellen Bestimmung der Ladungsdichte in Kristallen, I
  The Science of Nature, 1985
• Triple Crystal Diffractometer Investigations of Imperfections in Silicon Crystals with Laue-Case Diffraction
  Physica Status Solidi (a), 1982
• Triple crystal diffractometer investigations of silicon crystals with different collimator-analyzer arrangements
  Physica Status Solidi (a), 1982
• International Union of Crystallography. Commission on Crystallographic Apparatus and Commission on Charge, Spin and Momentum Densities. Extinction corrections: theory and experiment. Results of γ-ray diffractometry
  Acta Crystallographica Section A, 1977
• TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION
  Applied Physics Letters, 1965