The quantitative application of sims to cadmium mercury telluride

Publisher Website

1 January 1983

journal article
Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics

Vol. 46, 527-530
https://doi.org/10.1016/0020-7381(83)80168-5

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Quasisimultaneous SIMS, AES, XPS, and TDMS study of preferential sputtering, diffusion, and mercury evaporation in CdxHg1−xTe
Surface Science, 1981