Locatability of Faults in Combinational Networks
- 1 November 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-20 (11) , 1407-1412
- https://doi.org/10.1109/t-c.1971.223147
Abstract
A formal model for the study of reliable combinational networks is introduced and used to determine network properties conducive to the location of faults. The usual concept of fault location is generalized to be an interval on the partially ordered set of subsets of network nodes that classifies nodes into three disjoint sets: a faulty set, a fault-free set, and an indeterminate set. After developing basic properties of locatable faults, necessary and sufficient conditions for a fault to be locatable in an arbitrary network are stated and proven.Keywords
This publication has 5 references indexed in Scilit:
- Diagnosis of Single-Gate Failures in Combinational circuitsIEEE Transactions on Computers, 1969
- A Procedure for Selecting Diagnostic TestsIEEE Transactions on Computers, 1969
- Fault Testing and Diagnosis in Combinational Digital CircuitsIEEE Transactions on Computers, 1968
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966
- An Algorithm for Selecting an Optimum Set of Diagnostic TestsIEEE Transactions on Electronic Computers, 1965