Annealing of defects in irradiated silicon detector materials with high oxygen content
- 20 May 2005
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 17 (22) , S2247-S2253
- https://doi.org/10.1088/0953-8984/17/22/012
Abstract
No abstract availableKeywords
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