Laser-diode-stimulated emission depletion microscopy
- 29 April 2003
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 82 (18) , 3125-3127
- https://doi.org/10.1063/1.1571656
Abstract
We report subdiffraction resolution in far-field fluorescence microscopy through laser-diode-stimulated emission depletion of molecular markers. The diode-generated focal intensities lead to a resolution improvement by ∼45% in both lateral directions. Excitation and stimulated emission are performed with electronically synchronized diode pulses of 50–70 ps and 300–400 ps duration, respectively. The subdiffraction resolution is utilized to resolve neighboring individual molecules.Keywords
This publication has 5 references indexed in Scilit:
- Breaking Abbe’s diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapesPhysical Review E, 2001
- Implementation of intensity-modulated laser diodes in time-resolved, pump–probe fluorescence microscopyApplied Optics, 2001
- Monitoring the excited state of a fluorophore in a microscope by stimulated emissionBioimaging, 1995
- Monitoring the excited state of a fluorophore in a microscope by stimulated emissionBioimaging, 1995
- Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopyOptics Letters, 1994