Characteristic x-ray fluorescence correction in thin foil analysis
- 31 December 1980
- journal article
- Published by Elsevier in Micron (1969)
- Vol. 11 (3-4) , 325-326
- https://doi.org/10.1016/0047-7206(80)90034-5
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The quantitative analysis of thin specimensJournal of Microscopy, 1975